BS EN 60444-9-2007 石英晶体元件参数测量.压电晶体元件寄生振荡测量
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【英文标准名称】:Measurementofquartzcrystalunitparameters-Measurementofspuriousresonancesofpiezoelectriccrystalunits
【原文标准名称】:石英晶体元件参数测量.压电晶体元件寄生振荡测量
【标准号】:BSEN60444-9-2007
【标准状态】:现行
【国别】:英国
【发布日期】:2007-05-31
【实施或试行日期】:2007-05-31
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:晶体(电子);电气工程;电子工程;滤波器晶体;阻抗;测量;测量技术;参数;压电器件;共振频率;谐振器
【英文主题词】:Crystals(electronic);Electricalengineering;Electronicengineering;Filtercrystals;Impedance;Interferences;Measurement;Measuringtechniques;Parameters;Piezoelectricdevices;Resonantfrequency;Resonators
【摘要】:ThispartofIEC60444describestwomethodsfordeterminingthespurious(unwanted)modesofpiezoelectriccrystalresonators.Itextendsthecapabilitiesandimprovesthereproducibilityandaccuracycomparedtopreviousmethods.ThepreviousmethodsdescribedinIEC60283(1968)werebasedontheuseofameasuringbridge,whichappliestonon-traceablecomponentssuchasvariableresistorsandahybridtransformer,whicharenolongercommerciallyavailable.MethodA(Fullparameterdetermination)FullparameterdeterminationallowsthedeterminationoftheequivalentparametersofthespuriousresonancesandisbasedonthemethodsdescribedinIEC60444-5usingthesamemeasurementequipment.Itisthepreferredmethod,whichcanbeappliedtothemeasurementoflowandmediumimpedancespuriousresonancesuptoseveralkΩ.MethodB(Resistancedetermination)Resistancedeterminationshouldbeusedforthedeterminationofhighimpedancespuriousresonancesasspecified,forexampleforcertainfiltercrystals.ItusesthesametestequipmentasmethodAinconjunctionwithatestfixture,whichconsistsofcommerciallyavailablemicrowavecomponentssuchasa180°hybridcoupleranda10dBattenuator,whicharewell-definedina50Ωenvironment.Thismethodisanimprovementtothe“referencemethod”oftheobsoleteIEC60283.
【中国标准分类号】:L21
【国际标准分类号】:31_140
【页数】:18P.;A4
【正文语种】:英语
【原文标准名称】:石英晶体元件参数测量.压电晶体元件寄生振荡测量
【标准号】:BSEN60444-9-2007
【标准状态】:现行
【国别】:英国
【发布日期】:2007-05-31
【实施或试行日期】:2007-05-31
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:晶体(电子);电气工程;电子工程;滤波器晶体;阻抗;测量;测量技术;参数;压电器件;共振频率;谐振器
【英文主题词】:Crystals(electronic);Electricalengineering;Electronicengineering;Filtercrystals;Impedance;Interferences;Measurement;Measuringtechniques;Parameters;Piezoelectricdevices;Resonantfrequency;Resonators
【摘要】:ThispartofIEC60444describestwomethodsfordeterminingthespurious(unwanted)modesofpiezoelectriccrystalresonators.Itextendsthecapabilitiesandimprovesthereproducibilityandaccuracycomparedtopreviousmethods.ThepreviousmethodsdescribedinIEC60283(1968)werebasedontheuseofameasuringbridge,whichappliestonon-traceablecomponentssuchasvariableresistorsandahybridtransformer,whicharenolongercommerciallyavailable.MethodA(Fullparameterdetermination)FullparameterdeterminationallowsthedeterminationoftheequivalentparametersofthespuriousresonancesandisbasedonthemethodsdescribedinIEC60444-5usingthesamemeasurementequipment.Itisthepreferredmethod,whichcanbeappliedtothemeasurementoflowandmediumimpedancespuriousresonancesuptoseveralkΩ.MethodB(Resistancedetermination)Resistancedeterminationshouldbeusedforthedeterminationofhighimpedancespuriousresonancesasspecified,forexampleforcertainfiltercrystals.ItusesthesametestequipmentasmethodAinconjunctionwithatestfixture,whichconsistsofcommerciallyavailablemicrowavecomponentssuchasa180°hybridcoupleranda10dBattenuator,whicharewell-definedina50Ωenvironment.Thismethodisanimprovementtothe“referencemethod”oftheobsoleteIEC60283.
【中国标准分类号】:L21
【国际标准分类号】:31_140
【页数】:18P.;A4
【正文语种】:英语
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